Helios Nanolab dual beam FIB/SEM
• High resolution dual-beam Helios focussed ion beam/scanning electron microscope will be one of only 3 of this type in Australia.
• Sub-100 nm direct writing capability using ion beam
• Rapid, 3-D profiling using dual-beam capability will enable direct fabrication of nanostructures and analysis of nano-materials by ion beam milling.
*Image courtesy of FEI
For more detailed information on electron and ion beam techniques please read FEI's Introduction to electron microscopy
This equipment can be booked through ACLS after receiving the appropriate inductions.
