Equipment available through La-Trobe University
| Paul Pigram |
LaTrobe University |
03 9479 2618 p.pigram@latrobe.edu.au |
| Characterisation | Ultra DLD XPS - in situ sample prep | |
| Characterisation | Nova XPS - automated | |
| Characterisation | ToF-SIMS IV | |
| Characterisation | Asylum AFM - inverted µscope | |
| Characterisation | Asylum AFM - stand alone | |
| Andrew Peele |
LaTrobe University | 03 9479 2622 a.peele@latrobe.edu.au |
| Characterisation | Xradia X-ray microtomography | |
| Characterisation | Confocal µscopy - Fluorescence | |
| Characterisation | Fluorescence Correlation Spectroscopy (FCS) | |
| Nanoscale patterning | E-beam | |
| Etching | RIE | |
| Thin film deposition | Sputtering | |
