The Monash Centre for Electron Microscopy (MCEM)

In addition to its contribution to ANFF as Operator of the MCN, Monash University welcomes ANFF users to the deep expertise and excellent facilities for specialised nanoscale electron microscopy to be found in the Monash Centre for Electron Microscopy (MCEM), including

  • Transmission Electron Microscopes (TEM)
  • Scanning Electron Microscopes (SEM)
  • Focussed Ion Beam Microscopes
  • Atomic Probe Field Ion Microscopes
  • sample preparation – microtomes, coating, polishing, dicing

ANFF users from outside Monash University who may wish to access MCEM should in the first instance discuss their needs with MCN staff who will be happy to make introductions and facilitate access.

Contact

Dr Peter Miller,
Manager MCEM

       +61 3 9905 5291

      peter.miller @ mcem.monash.edu.au

http://mcem.monash.edu.au/index.html

 

 


(deprecated:)

Peter
Miller
Monash 03 9905 5291
peter.miller@mcem.monash.edu.au
Lithography/Characterisation FEI Quanta 3D FIB-SEM
Characterisation JEOL JEM 2100F FEGTEM (2008)
Characterisation Philips CM20 TEM (1992)
Characterisation JEOL JEM 2011 TEM (2000)
Characterisation JEOL JSM 7001F FEGSEM
Characterisation JEOL JSM-840A SEM (1986)
Characterisation JEOL JSM 6300F FEGSEM (1991)
Characterisation Philips EM420 (1983)
Characterisation Reichert FCS Cryo-microtome
Characterisation Reichert Ultracut E microtome
Characterisation/Visualization Olympus Optical microscope with CCD camera
Sample preparation Struers Tenupol 2, 3, 5 Twin Jet Electro-Polishers
Sample preparation Atom Probe Tip Polisher (in-house)
Sample preparation Cressington 208HR Sputter Coater
Sample preparation Dynavac Evaporative Coater
Sample preparation Dynavac SC150 Sputter Coater
Sample preparation
Gatan 691 Precision Ion Polishing System (PIPS), two systems
Sample preparation
Gatan 682 Precision Etching and Coating System (PECS) and Perpendicular Slope Cutting Tool
Sample preparation Gatan 950 Solarus Advanced Plasma System
Sample preparation Gatan 656 Dimple Grinder
Sample preparation Gatan 601 Ultrasonic Disc Cutter
Sample preparation Struers Accutom 50 Precision Saw
Sample preparation Gentle Mill
Laboratory Darkroom Facilities
Characterisation Image Plate Reader (Ditabis Micron)
Laboratory Computer room and various software packages