Equipment available at Monash MCEM facility
| Peter Miller |
Monash | 03 9905 5291 peter.miller@mcem.monash.edu.au |
| Lithography/Characterisation | FEI Quanta 3D FIB-SEM | |
| Characterisation | JEOL JEM 2100F FEGTEM (2008) | |
| Characterisation | Philips CM20 TEM (1992) | |
| Characterisation | JEOL JEM 2011 TEM (2000) | |
| Characterisation | JEOL JSM 7001F FEGSEM | |
| Characterisation | JEOL JSM-840A SEM (1986) | |
| Characterisation | JEOL JSM 6300F FEGSEM (1991) | |
| Characterisation | Philips EM420 (1983) | |
| Characterisation | Reichert FCS Cryo-microtome | |
| Characterisation | Reichert Ultracut E microtome | |
| Characterisation/Visualization | Olympus Optical microscope with CCD camera |
|
| Sample preparation | Struers Tenupol 2, 3, 5 Twin Jet Electro-Polishers | |
| Sample preparation | Atom Probe Tip Polisher (in-house) | |
| Sample preparation | Cressington 208HR Sputter Coater | |
| Sample preparation | Dynavac Evaporative Coater | |
| Sample preparation | Dynavac SC150 Sputter Coater | |
| Sample preparation |
Gatan 691 Precision Ion Polishing System (PIPS), two systems | |
| Sample preparation |
Gatan 682 Precision Etching and Coating System (PECS) and Perpendicular Slope Cutting Tool | |
| Sample preparation | Gatan 950 Solarus Advanced Plasma System | |
| Sample preparation | Gatan 656 Dimple Grinder | |
| Sample preparation | Gatan 601 Ultrasonic Disc Cutter | |
| Sample preparation | Struers Accutom 50 Precision Saw | |
| Sample preparation | Gentle Mill | |
| Laboratory | Darkroom Facilities | |
| Characterisation | Image Plate Reader (Ditabis Micron) | |
| Laboratory | Computer room and various software packages | |
