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Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry
Ultramicroscopy
V. Adineh, R. Marceau, Y. Chen, K. Si, T. Velkov, W. Cheng, J. Li, J. Fu
Ultramicroscopy
V. Adineh, R. Marceau, Y. Chen, K. Si, T. Velkov, W. Cheng, J. Li, J. Fu