University of Melbourne

The University of Melbourne through the Materials Characterisation and Fabrication Platform (MCFP) has made available a wide range of tools and facilities to the ANFF user community, notably including

  • Ion-beam implantation, doping and analytical techniques including IBIC and PIXE
  • Electronic property measurement including DLTS
  • Specialised bio-compatible electronics and materials
  • Sophisticated particle characterisation systems for soft materials fabrication

Below is a list of the tools and equipment available to ANFF users:

  • Olympus confocal microscope with integrated spectrograph and UV-Vis spectrophotometer used for advanced spectroscopic techniques, allowing the detection and characterisation of single nanoparticles.
  • Agilent 8453 UV-VIS Spectrophotometer
  • Cary 4000 UV-VIS Spectrophotometer with diffuse reflectance accessory 
  • Nikon 3D N-STORM, used for two colour fluorescence imaging with 20nm resolution 
  • Applied Precision OMX BLAZE, 3D used for three colour fluorescence, capsules and live-cell imaging, 100nm resolution
  • Applied Precision Deltavision, 3D used for four colour, capsules and live-cell imaging, 250nm resolution
  • Leica SP2-FLIM Confocal, 3D used for micro- and nano-capsule material characterisation, 250nm resolution
  • Amnis ImageStream 100 Imaging Flow Cytometer, used for high throughput imaging, 500nm resolution for cell or particle characterisation
  • Partec Cyflow Space Flow Cytometer, with two-laser six-colour, 500nm detection limit for cell or particle characterisation
  • Apogee µFlow Cyotmeter, with three-laser seven-colour, 200nm detection limit for cell or particle characterisation
  • Atomic Force Microscope, Asylum Research, MFP3D mounted on an inverted fluorescence microscope for imaging materials and biological systems with integrated fluorescence capability in a PC2 facility.
  • Atomic Force Microscope, MFP3D mounted on an inverted microscope with acoustic hood for imaging transparent or opaque materials and nano-mechanical characterisation.
  • Atomic Force Microscope, Cypher small sample high resolution imaging SPM for small sample, high resolution, high speed imaging with atomic resolution in some systems.
  • Atomic Force Microscope, Dimension 3100, Nanoscope IIIa controller for large sample imaging system (4 to 6 inch wafer)
  • Atomic Force Microscope, Multimode, Nanoscope IV controller for small sample imaging system
  • Quorum Technologies, Emitech K575X Turbo Sputter Coater with turbo pump enabled sputter coater for oxidising and non-oxidising metals, 1.5 inch sample diameter
  • DataPhysics, OCA-20 contact angle meter and tensiometer to measure wetting properties of surfaces in air or in liquids
  • White light ellipsometer for thin film thickness measurements
  • Quartz crystal microgravimetry for measuring surface adsorption in material coatings
  • Varian 7000 Fourier Transform-IR Spectrophotometer
  • Multiple angle dynamic light scattering system
  • Malvern HPPS particle sizer (DLS)
  • Malvern Zetasizer for measuring charge characteristics of particles, drops, and micelles using electro-kinetic methods
  • NEC 5U Pelletron, operating as a high brightness source of light ions operating at charging potentials of 0.5 to 5 MeV for Ion Implantation with the following capabilities: Rutherford Backscattering (RBS), Proton Induced X-ray emission (PIXE), Ion Beam Induced Charge measurements (IBIC), Channelling Contrast Microscopy (CCM), Scanning Transmission Ion Microscopy (STIM)
  • Orsay Physics Focussed Ion Beam (FIB) with crossed electron beam for performing concurrent SEM measurements
  • Colutron low energy ion implanter (0.01-15 keV) predominantly used for phosphorus implantation of Quantum Devices
  • Class 350 Cleanroom
  • Class 35 laminar flow cabinet
  • Neutronix Quintel Q4000-6 UV Photolithographic Processing including mask aligner
  • Star Cryo-electronics DC SQUID
  • SULA Deep Level Transient Spectroscopy system (DLTS)
  • Reinshaw RM 1000 single grating, extended wavelength Raman/luminescence system including a Coherent 190 FRED, Kimmon HeCd and Stellar Pro 514 Modulaser
  • InVia Micro-Raman Spectrometer

Lauren Hyde 
03 8344 0176

Associate Prof. Jeff McCallum
03 8344 8072