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Stand-Out: A Novel Approach for Preparing Sub-100 nm Samples Through in situIon Induced Bending
Microscopy and Microanalysis
V. Garg, S. Zhang, R. G. Mote, Y. Chen, L. Cao, J. Fu
Microscopy and Microanalysis
V. Garg, S. Zhang, R. G. Mote, Y. Chen, L. Cao, J. Fu
