MCN will be hosting a seminar on its latest equipment addition, a scattering-type Scanning Near-field Optical Microscope (s-SNOM).
The seminar will be held in MCN at 11am on Tuesday, 22 November 2016 and hosted by Adrian Cernescu from Neaspec.
The technique allows the user to overcome the diffraction limit of conventional light microscopy or spectroscopy. This enables optical measurements at a spatial resolution of 10nm, not only at visible frequencies but also in the infrared or terahertz spectral range. Several applications of nano-imaging and spectroscopy on different materials will be presented.
The talk will be accompanied by a tour of MCN for those that are yet to see the facility’s latest offerings.