MCN Seminar: s-SNOM technology for nanoscale analytics
Figure above: Imaging of a 10 nm thin PEO monolayer at 1123 cm-1 (asy. C-O-C stretching) shows self-assembled nano-structures and areas of different material thickness. High contrast absorption images allow to clearly distinguish between mono- and bilayer film areas
Dr. Adrian Cernescu, a senior application engineer of Attocube systems AG, Munich, Germany, will be presenting a seminar and hands on demonstration on scattering-type Scanning Near-field Optical Microscopy (s-SNOM) on 8th April 2022.
The talk will focus on s-SNOM capabilities and different applications such as characterization of polymer blends or phase change polymers with nanometer-scale domains. Quantification of free-carrier concentration and carrier mobility in doped semiconductor nanowires, analysis of 2D (graphene) nanostructures, or study phase propagation mechanisms in energy storage materials is achieved by amplitude- and phase-resolved near-field optical imaging.
A broad range of applications of the s-SNOM technology for biomaterials, inorganics and 2D materials research, will be presented.
The event will also be broadcast online for those that can’t be here in person.
Meeting ID: 859 8956 8025