Publications
Your Results
Indium tin oxide film characterization using the classical Hall Effect
COMMAD 2014
L.van Beveren, E.Panchenko, N.Anachi. L.Hyde, D.Smith, T.James, A.Roberts, J.McCallum
COMMAD 2014
L.van Beveren, E.Panchenko, N.Anachi. L.Hyde, D.Smith, T.James, A.Roberts, J.McCallum
