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Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition
Scientific Reports
Amador-Alvarado S., Flores-Camacho J.M., Sol­s-Zamudio A., Castro-Garc­a R., P?rez-Huerta J.S., Antœnez-Cer›n E., Ortega-Gallegos J., Madrigal-Melchor J., Agarwal V., Ariza-Flores D.

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